SCANNING ELECTRON MICROSCOPY
SEM ANALYSIS WITH EDS CAPABILITIES
In order to analyze and examine solid inorganic materials, a process called Scanning Electron Microscopy (SEM) is utilized, in which an electron beam is used to produce a highly magnified image of the sample for analysis. The SEM method is also referred to as SEM microscopy or SEM analysis, and it is widely utilized for microanalysis and failure analysis. SEM microscopy provides high-resolution images and accurate measurements of very small features and objects, and it is used extensively at Zhejiang Guojian Testing Technology Co., Ltd (CCT) in China. Our SEM services include Energy Dispersive X-ray Spectroscopy (EDS) capabilities, which enhance the accuracy and efficiency of our analysis.
SEM ANALYSIS APPLICATIONS
SEM analysis is a technique that uses an electron beam to scan a sample and create a highly magnified image for analysis. This process can reveal detailed information about the sample's external morphology, chemical composition, and the orientation of its constituent materials. In addition, the use of Energy Dispersive X-ray Spectroscopy (EDS) can provide qualitative and semi-quantitative information on the sample's elemental composition, identify foreign inorganic substances, and detect coatings on metal surfaces. At Zhejiang Guojian Testing Technology Co., Ltd (CCT) in China, we offer scanning electron microscopy services that utilize both SEM and EDS capabilities.
Discuss your requirements for electron microscopy services with our team today.
RELIABLE SYSTEM WITH VALUABLE FEATURES
Zhejiang Guojian Testing Technology Co., Ltd (CCT) has the capabilities to perform Scanning Electron Microscopy by using an advanced Hitachi S-3400N SEM with an EDAX EDS. The SEM equipment has a variable pressure system that can handle both wet and non-conductive samples with little preparation required. The equipment's large sample chamber allows for examination of samples up to 200 mm in diameter and 80 mm in height, with high-resolution images generated at magnifications ranging from 5x to 30,000x. The EDS system features a silicon drift detector (SDD) that delivers rapid analysis and high energy resolution compared to traditional SiLi detectors. The system is powered by the advanced TEAM software package, which enables material characterization through techniques such as line scans, element mapping, and spectral analysis.
Zhejiang Guojian Testing Technology Co., Ltd (CCT) CAPABILITIES
· SEM Analysis with EDS – qualitative and semi-quantitative results
· Magnification – from 5x to 30,000x
· Sample Size – up to 200 mm (7.87 in.) in diameter and 80 mm (3.14 in.) in height
· Materials Analyzed – solid inorganic materials including metals and polymers
THE SEM ANALYSIS PROCESS
SEM analysis is a technique that involves the use of a beam of high-energy electrons to generate signals from a solid specimen's surface. The collected data is then used to create a two-dimensional image that displays variations in properties, such as chemical characterization, texture, and material orientation. In addition, SEM can perform point analyses that help to qualitatively or semi-quantitatively determine the sample's crystalline structure, crystal orientation, and chemical composition.
The EDS detector is responsible for separating the characteristic X-rays of different elements into an energy spectrum, which is then analyzed using EDS software to determine the abundance of specific elements. The spectrum is typically displayed as a plot of X-ray counts vs. energy (in keV), with energy peaks corresponding to different elements present in the sample. The EDS system can be used to determine the chemical composition of materials at a spot size as small as a few microns and can create element composition maps over a larger raster area. These capabilities provide essential information on the composition of various materials, including metals and polymers.
