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ICP ANALYSIS

ICP-AES & ICP-MS METHODS

ICP Analysis or ICP Testing is a chemical analysis method used for identifying and measuring various chemical elements in metal samples. This technique is suitable for both solid and liquid samples and can provide both quantitative and qualitative data. The analytical results obtained from ICP analysis are typically included in an ICP test report.


LATEST TECHNOLOGY FOR MAJOR, MINOR AND TRACE ELEMENT ANALYSIS

CCT offers ICP metal analysis services and , ICP analysis can reveal several non-metals.

ICP AES Analysis

ICP Atomic Emission Spectroscopy, also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), is a highly sensitive analytical technique that can accurately measure the concentrations of major and trace elements in solid or liquid samples. This method is capable of detecting almost all elements in the periodic table, and can provide reliable results for around 70 elements, with detection limits in the parts per billion range.

ICP MS Analysis

ICP-MS, or Inductively Coupled Plasma Mass Spectrometry, is a powerful analytical technique that can detect and quantify trace and ultra-trace levels of multiple elements in a wide range of materials, from superalloys to high-purity substances. It is a highly sensitive method that can provide precise and accurate measurements of the elemental composition of a sample, even at concentrations as low as parts per trillion.


TEST METHODS/SPECIFICATIONS

ICP-AES

· ASTM E2371

· ASTM E2594

· ASTM E3061

ICP-MS

· ASTM E2823

ELEMENTS ANALYZED DURING AN ICP TEST SCAN

Aluminum

Antimony

Arsenic

Barium

Beryllium

Boron

Cadmium

Calcium

Cerium

Cesium

Chromium

Cobalt

Copper

Dysprosium

Erbium

Europium

Gadolinium

Gallium

Germanium

Gold

Hafnium

Holmium

Indium

Iridium

Iron

Lanthanum

Lead

Lithium

Lutetium

Magnesium

Manganese

Mercury

Molybdenum

Neodymium

Nickel

Niobium

Osmium

Palladium

Phosphorus

Platinum

Polonium

Potassium

Praseodymium

Rhenium

Rhodium

Rubidium

Ruthenium

Samarium

Scandium

Selenium

Silicon

Silver

Sodium

Strontium

Sulfur

Tantalum

Technetium

Tellurium

Thallium

Thorium

Thulium

Tin

Titanium

Tungsten

Uranium

Vanadium

Ytterbium

Yttrium

Zinc

Zirconium

 

 

 

 

 

 

 

 

 

The only elements which cannot be measured by ICP methods are C, H, O, N and the halogens.

Contact our team to discuss your sample and testing requirements. To learn more about the sample size required for your ICP test.


THE ICP TEST PROCESSES

 

At CCT, both ICP analysis methods are conducted using state-of-the-art spectrometers controlled by computer software. These spectrometers utilize Charge Coupled Device (CCD) technology to measure a broad range of elements accurately. ICP analysis can be performed on both liquid and solid samples, but for solid samples, it is necessary to dissolve them in a solvent, usually an acid, to produce a solution. The sample solution is then introduced into the ICP as an aerosol of droplets using a nebulizer that aspirates the sample with high velocity argon to form a fine mist.

 

The aerosol then enters a spray chamber where larger droplets are eliminated. The smaller droplets that can be vaporized pass through the torch body, where they are mixed with additional argon gas. ICP stands for Inductively Coupled Plasma, which is an excitation source created by directing the energy of a radio frequency generator into a suitable gas. A coupling coil transmits radio frequency to the heated argon gas, producing an argon plasma located in the torch. The hot plasma dries any remaining solvent and causes sample atomization.

 

ICP-AES spectrometers measure atomic emissions as light, while ICP-MS utilizes ionization to determine the mass of ions present in the sample, indicating the elements present in the sample.


CCT CAPABILITIES

· ICP-MS Analysis and ICP-AES Analysis

· Detection of chemical elements

· Quantitative elemental composition

In addition to ICP analysis, CCT offers a broad range of analytical chemistry services for your samples, specifications and information requirements.